Systems and methods for correcting optical reflectance...

Details Systems and methods for correcting optical reflectance... Systems and methods for correcting optical reflectance...

2006-04-25

2009-11-10

Toatley, Jr., Gregory J (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

C356S326000, C600S310000

Reexamination Certificate

active

07616303

ABSTRACT:
We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.

REFERENCES:
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patent: 7217266 (2007-05-01), Anderson et al.
patent: 2005/0002031 (2005-01-01), Kraemer et al.
patent: 2007/0135844 (2007-06-01), Balzano

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