System of digitally testing an analog driver circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07466156

ABSTRACT:
A circuit of testing an analog driver circuit using digital scan-based test methodologies. The circuit of the present invention includes a control circuit for generating signals in response to a test enable signal, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal in response to the differential input signal and the signals generated by the control circuit, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit in response the signals generated by the control circuit, and a differential receiver circuit for receiving the differential output from the differential driver circuit, convert the differential output signal to a single ended signal and transmitting the single ended signal, all in response to the test enable signal.

REFERENCES:
patent: 4298980 (1981-11-01), Hajdu et al.
patent: 5107208 (1992-04-01), Lee
patent: 5481471 (1996-01-01), Naglestad et al.
patent: 5610530 (1997-03-01), Whetsel
patent: 5657456 (1997-08-01), Gist et al.
patent: 5861774 (1999-01-01), Blumenthal
patent: 6011387 (2000-01-01), Lee
patent: 6185710 (2001-02-01), Barnhart
patent: 6535945 (2003-03-01), Tobin et al.
patent: 6609221 (2003-08-01), Coyle et al.
patent: 6680681 (2004-01-01), Hsu et al.
“Digital Systems Testing and Testable Design”, IEEE Press, Ch. 9.3-9.9, 1990.
“BIST for D/A and A/D Converters”, IEEE Design & Test of Computers v. 13 n. 4 Winter 1996, pp. 40-49.
U.S. Appl. No. 10/604,025, “Data Transceiver and Method for Equalizing the Data Eye of a Differential Input Data Signal”, Camara, et al.

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