Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2006-12-19
2009-10-06
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07600156
ABSTRACT:
A method, device, and system including built-in self tests for a communication bus device is disclosed. In one form, a method of testing a device operable to be coupled to a communication port an information handling system includes accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system. The method can also include detecting a self-test descriptor associated with the configuration descriptor and testing a portion of the first device using test information associated with the self-test descriptor. The device and system can include logic to perform the methods described herein.
REFERENCES:
patent: 5617430 (1997-04-01), Angelotti et al.
patent: 6467054 (2002-10-01), Lenny
patent: 6954712 (2005-10-01), Bingham et al.
patent: 7162554 (2007-01-01), Cole et al.
patent: 2004/0158787 (2004-08-01), Zayas et al.
patent: 2005/0240711 (2005-10-01), Watanabe
patent: 2007/0226733 (2007-09-01), Bendixen et al.
Chaiken Craig
Makhija Vinod
O'Rourke Andrew
Thornley Bryan J.
Dell Products LP
Iqbal Nadeem
Larson Newman & Abel LLP
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