Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-04-23
2009-08-04
Garbowski, Leigh Marie (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07571421
ABSTRACT:
A method, computer-readable medium, and system for performing data preparation are provided. An integrated circuit design is received, and a plurality of pre-optical proximity correction processes are invoked such that the plurality of pre-optical proximity correction processes are performed in parallel. An optical proximity correction process is invoked in response to a determination that each of the plurality of pre-optical proximity correction processes have completed. A post-optical proximity correction process is invoked in response to a determination that the optical proximity correction process has completed.
REFERENCES:
patent: 7024655 (2006-04-01), Cobb
patent: 7318214 (2008-01-01), Prasad et al.
patent: 7418693 (2008-08-01), Gennari et al.
patent: 2006/0228041 (2006-10-01), Joshi
patent: 2008/0189673 (2008-08-01), Ying
Chen Peng-Ren
Huang Chien-Chao
Tu Chih-Chiang
Garbowski Leigh Marie
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company
LandOfFree
System, method, and computer-readable medium for performing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System, method, and computer-readable medium for performing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System, method, and computer-readable medium for performing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4117466