Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-03-25
2008-03-25
Whitmore, Stacy (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07350168
ABSTRACT:
A system, method and computer program product are provided for equivalency checking between a first design and a second design having sequential differences. To accomplish the equivalency checking, sequential differences between a first design and a second design are identified. It is then determined whether the first design and the second design are equivalent, utilizing the identified sequential differences.
REFERENCES:
patent: 2002/0059481 (2002-05-01), Nunally
patent: 2003/0217345 (2003-11-01), Rajsuman et al.
patent: 2004/0054875 (2004-03-01), Segelken
Corno, F., et al., “Simulation based sequential equivalence checking of RTL VHDL”, IEEE, 1999. pp. 351-354.
Cabodi, G. et al., “Sequential circuit diagnosis based on formal verification techniques”, IEEE 1992., pp. 187-196.
Corno, F. et al., “Verifying the equivalence of sequential circuits with benetic algorithms”, IEEE, 1999. pp. 1293-1298.
Corno, F. et al., “On the test of micorprocessor cores”, IEEE, 2001. pp. 209-213.
Corno, F., “Automatic test program generatin from RT-level microprocessor descriptions”, IEEE. @002. pp. 1-6.
Goyal Deepak
Hasteer Gagan
Mathur Anmol
Mukherjee Rajarshi
Sharma Nikhil
Calypto Design Systems, Inc.
Whitmore Stacy
Zilka-Kotab, PC
LandOfFree
System, method and computer program product for equivalence... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System, method and computer program product for equivalence..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System, method and computer program product for equivalence... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2816078