System-level test architecture for delivery of compressed tests

Details System-level test architecture for delivery of compressed tests System-level test architecture for delivery of compressed tests

2007-10-02

2007-10-02

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

10795231

ABSTRACT:
An integrated circuit comprising at least one system level decompressor and at least a first hardware block associated with a core level decompressor. The system level decompressor is capable of performing system level decompression of received compressed test data to form partially decompressed test data. The core level decompressor being capable of performing core level decompression of the partially decompressed test data.

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