Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-06-21
2005-06-21
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S760020
Reexamination Certificate
active
06909299
ABSTRACT:
An electromechanical system for testing IC-chips includes a total of N chip holding subassemblies; a moving mechanism for automatically moving the i-th chip holding subassembly from a load position in the system to the test position in the systems, and visa-versa, where i ranges from 1 to N and changes with time in a sequence; and a signal generator which sends test signals to the IC-chips at the test position. Between the moving of the i-th chip holding subassembly and the next subassembly in the sequence, test signals are sent to the IC-chips on all N of the chip holding subassemblies such that the signals are shifted in time from one subassembly to another. Also, while the i-th chip holding subassembly is being moved, the time shifted test signals continue to be sent to the IC-chips on the remaining N−1 chip holding subassemblies.
REFERENCES:
patent: 6307388 (2001-10-01), Friedrich et al.
patent: 6307391 (2001-10-01), Tustaniwskyj et al.
patent: 6325662 (2001-12-01), Tustaniwskyj
patent: 6415409 (2002-07-01), Rhodes et al.
patent: 6522156 (2003-02-01), Tustaniwskyj et al.
patent: 6581486 (2003-06-01), Ditri et al.
patent: 6658736 (2003-12-01), Babcock et al.
patent: 6774661 (2004-08-01), Tustaniwskyj et al.
patent: 6809543 (2004-10-01), Tustaniwskyj et al.
Brafford James Mason
Connacher Terry Sinclair
Montgomery John Charles
Mortensen David Jon
Rhodes James Vernon
Fassbender Charles J.
Hollington Jermele
Nguyen Vinh
Rode Lise A.
Starr Mark T.
LandOfFree
System for testing multiple groups of IC-chips which... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for testing multiple groups of IC-chips which..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for testing multiple groups of IC-chips which... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3521739