Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-03-28
2009-02-03
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07487490
ABSTRACT:
A system and method for integrated circuit design are disclosed to enhance manufacturability of circuit layouts by applying layout processing to handle imperfections such as jogs in integrated circuit design layouts. The layout processing may be applied to jogs in the original integrated circuit design layout or jogs created post-design by process biases, as well as design rule check and Boolean processes or process compensation.
REFERENCES:
patent: 6523162 (2003-02-01), Agrawal et al.
patent: 6625801 (2003-09-01), Pierrat et al.
patent: 7159197 (2007-01-01), Falbo et al.
patent: 7181721 (2007-02-01), Lippincott et al.
Lai Weinong
Zhang Youping
Chiang Jack
Milks, III William C.
Tat Binh C
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