System for scanning probe microscope input device

Details System for scanning probe microscope input device System for scanning probe microscope input device

2006-10-31

2010-02-09

Souw, Bernard E (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Electron probe type

C250S306000, C250S307000, C850S001000, C850S002000, C850S003000, C033S503000, C033S504000, C073S105000

Reexamination Certificate

active

07659509

ABSTRACT:
In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.

REFERENCES:
patent: 5376790 (1994-12-01), Linker et al.
patent: 5496999 (1996-03-01), Linker et al.
patent: 5753911 (1998-05-01), Yasuda et al.
patent: 5877891 (1999-03-01), Park et al.
patent: 5939719 (1999-08-01), Park et al.
patent: 5948972 (1999-09-01), Samsavar et al.
patent: 5965881 (1999-10-01), Morimoto et al.
patent: 6144028 (2000-11-01), Kley
patent: 6220099 (2001-04-01), Marti et al.
patent: 6229138 (2001-05-01), Kley
patent: 6232597 (2001-05-01), Kley
patent: 6242734 (2001-06-01), Kley
patent: 6246054 (2001-06-01), Toda et al.
patent: 6281491 (2001-08-01), Kley
patent: 6339217 (2002-01-01), Kley
patent: 6441371 (2002-08-01), Ahn et al.
patent: 6515277 (2003-02-01), Kley
patent: 6559931 (2003-05-01), Kawamura et al.
patent: 6960765 (2005-11-01), Tomimatsu et al.
patent: 7392692 (2008-07-01), Noda
patent: 2002/0135755 (2002-09-01), Kley
patent: 2003/0048438 (2003-03-01), Kawamura et al.
patent: 2005/0269495 (2005-12-01), Kakemizu
patent: 2006/0113469 (2006-06-01), Baba et al.
patent: 2007/0194225 (2007-08-01), Zorn
patent: 2008/0142708 (2008-06-01), Workman et al.
patent: 2008/0151256 (2008-06-01), Kikawa et al.
patent: 2008/0257023 (2008-10-01), Jordil et al.
patent: 2009/0024020 (2009-01-01), Swaminathan et al.
patent: 2009/0062935 (2009-03-01), Abramovitch et al.

Affiliated with

Also associated with

Rating

System for scanning probe microscope input device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for scanning probe microscope input device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for scanning probe microscope input device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4227534