System for preventing radiation failures in programmable logic d

Electronic digital logic circuitry – Interface – Current driving

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326 91, 326 39, 326 9, 326 10, 326 11, 326 12, 326 13, 326 14, 326 37, 326 40, 326 41, G06F 738, H03K 190175

Patent

active

061042110

ABSTRACT:
A radiation-tolerant logic circuit includes three similarly configured SRAM-based PLDs. These PLDs work in parallel to provide identical logic functions. To guard against data corruption that can result from radiation-induced upsets, the logic circuit includes a state-comparison circuit that periodically performs a bitwise comparison of the configuration and user data from each of the PLDs; if a bit from one PLD differs from the corresponding bit from the others, the state-comparison circuit sets a flag that indicates that the differing PLD is in error. The erroneous PLD is then reprogrammed using error-free state data. In one embodiment, the error-free state data is read from an error-free PLD.

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patent: 5590305 (1996-12-01), Terrill et al.
patent: 5603043 (1997-02-01), Taylor et al.
"The Programmable Logic Data Book", 1998, available from Xilinx, Inc., 2100 Logic Drive, San Jose, California 95124, pp. 4-56 to 4-59.
Wolfgang Hoflich, Applications Note, "Using the XC4000 Readback Capability", XAPP 015.000, 1993 pp. 8-37 to 8-44.

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