System for modeling an integrated chip package and method of ope

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364488, 364489, 364490, G06F 1750

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055792499

ABSTRACT:
A system for modeling an integrated chip package and a method of operation is disclosed that includes a parametric processor (1) that provides parameters to define the parts of the package to a volume generator (2). The volume generator (2) uses the parameters to create volumes associated with each part of the integrated chip package. The system (3) provides the volume coordinates to a mesh generator (4). The mesh generator (4) further subdivides the volumes into elements, the elements being small enough for use in finite element analysis. The output of the mesh generator (4) is provided to a finite element analysis processor (5). The finite element analysis processor (5) conducts a physical stress or thermal stress analysis on the package using the elements created by the mesh generator (4). Once the finite element analysis processor (5) has completed its analysis of the package, the result is displayed on a display (6).

REFERENCES:
patent: 4797842 (1989-01-01), Nackman et al.
patent: 4841479 (1989-06-01), Tsuji et al.
patent: 4969116 (1990-11-01), Wada et al.
patent: 5029119 (1991-07-01), Konno
patent: 5214752 (1993-05-01), Meshkat et al.
patent: 5282140 (1994-01-01), Tazawa et al.
patent: 5307296 (1994-04-01), Uchida et al.
patent: 5315537 (1994-05-01), Blacker
patent: 5442569 (1995-08-01), Osano
Machine Design; vol. 63, No. 8; Apr. 23, 1992; Cleveland, US; pp. 65-69;`So You Want To Do A Little Electrical Work`; Dvorak, Paul.
IEEE Spectrum; vol. 28, No. 11; Nov. 1991; US; pp. 34-37; `Simulating EM Fields`; Swanson Jr. et al.
Fifth Annual IEEE Semiconductor Thermal And Temperature Measurement Symposium; Feb. 7, 1989; US; pp. 59-62; `finite element thermal analysis of 144 pin plastic flat packs`; Cooke et al.
Toute L'Electronique; No. 548; Nov. 1989; Paris, France; pp. 78-84; `la cao au service du packaging electronique`; Lefevre, Fran.cedilla.ois.
DiOrio et al., "Material Effects on the Performance and Reliability of High-Power Molded Dual-In-Line Packages," 38.sup.th Annual Conference on Electronic Components, 1988, pp. 406-410.
Yeh et al., `Correlation of Analytical and Experimental Approaches to Determine thermally Induced PWB Warpage,` IEEE Trans. on Components, Hybrids, and Manufacturing Technology, vol. 16, No. 8, Dec. 1993, pp. 986-995. (manuscript rec'd Jun. 25, 1992).
Cooke et al., "Finite Element Thermal Analysis of 144 Pin Plastic Flat Packs," Fifth IEEE Semi-Therm.TM. Symposium, 1989, pp. 59-62.
Schroen et al., "Finite Element Analysis Application to Semiconductor Devices," 1988 IEEE/AESS Dayton Chapter Symposium, pp. 35-46.

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