Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth
Reexamination Certificate
2005-04-05
2005-04-05
Hiteshew, Felisa (Department: 1765)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Processes of growth from liquid or supercritical state
Having pulling during growth
C117S217000, C117S218000, C117S222000
Reexamination Certificate
active
06875269
ABSTRACT:
Methods and apparatuses are useful to add polycrystalline rod material to the crucible of a CZ furnace and thereby increase utilization of crucible volume in the production of large diameter CZ silicon ingots. Multiple silicon rods are melted in the CZ furnace, and the subsequent production of a single crystal silicon ingot can occur without operating the isolation valve or opening the upper chamber of the furnace.
REFERENCES:
patent: 5888293 (1999-03-01), Tatsuhiro et al.
patent: 5900059 (1999-05-01), Shimanuki et al.
patent: 6036776 (2000-03-01), Kotooka et al.
patent: 6444028 (2002-09-01), Frauenknecht et al.
patent: 6461426 (2002-10-01), Inoue et al.
patent: 20030183161 (2003-10-01), Nakano et al.
patent: 10025863 (2000-05-01), None
patent: 2000-178096 (2000-06-01), None
patent: 2000-313690 (2000-11-01), None
patent: 2000-344594 (2000-12-01), None
patent: 2001-19587 (2001-01-01), None
patent: 2002-210355 (2002-07-01), None
patent: 0194669 (2001-12-01), None
Hartmann Torsten H.
Wood Henry Dare
Advanced Silicon Materials LLC
Hiteshew Felisa
Klarquist & Sparkman, LLP
LandOfFree
System for increasing charge size for single crystal silicon... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for increasing charge size for single crystal silicon..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for increasing charge size for single crystal silicon... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3410568