System for imaging and detecting threshold phenomena associated

Details System for imaging and detecting threshold phenomena associated System for imaging and detecting threshold phenomena associated

1992-11-20

1994-01-25

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

250307, 2041531, 204400, 204412, H01J 3728

Patent

active

052818144

ABSTRACT:
A microwave sweep oscillator is used to apply an AC signal from the probe tip of a scanning tunneling microscope to a sample, and the reflected signal from the sample is measured by a microwave spectrum
etwork analyzer, or another device capable of measuring amplitude versus frequency. The frequency of the signal applied by the oscillator may be swept across a spectrum and the optimum frequency of the spectrum is determined so that an improved image of the surface of a sample may be obtained. The spectrum of a known substance may also be recorded and used as a signature for identifying components of an unknown substance by comparison. When the amplitude of the AC signal applied is increased, a sudden change in the re

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W. Seifert et al., "Scanning Tunneling Microscopy At Microwave Frequencies," Ultramicroscopy 42-44; 379-387 (1992).
W. Seifert et al., "Scanning Tunneling Microscopy at Microwave Frequencies," Korrigierte Version (Nov. 6, 1991) published in Ultramicroscopy 42-44; 379-387 (1992).
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