System for evaluating and reporting semiconductor test processes

Details System for evaluating and reporting semiconductor test processes System for evaluating and reporting semiconductor test processes

1997-09-26

2000-05-30

Callahan, Timothy P.

Data processing: measuring, calibrating, or testing

Testing system

Including specific communication means

702182, G05B 1500

Patent

active

060701315

ABSTRACT:
A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.

REFERENCES:
patent: 5440478 (1995-08-01), Fisher et al.
patent: 5661669 (1997-08-01), Mozumder et al.
Judith Gersting, Mathematical Structures for Computer Science, Computer Science Press, p. 156, no known month 1993.

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