Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Patent
1989-05-23
1990-03-20
Tokar, Michael J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
356364, 350356, G01R 2316
Patent
active
049104543
ABSTRACT:
An electrical signal sampling system uses ultrashort optical pulses (of the order of 10 ps of less) to probe the electrical field from the signal being sampled. The probe is comprised of a modulator in the form of a Fabry-Perot optical interferometer (FP) incorporating a thin film of electro-optic material which may either be an index varying or piezo-electric material. This material, incorporated within the FP and subjected to an electric field, will cause a change in optical transmission characteristic by changing the optical path difference of the FP cavity. The bandwidth for the edge of the transmission window of the FP becomes much greater (by at least approximately 10 times) than the bandwidth of the optical pulses. The thickness or index of the electro-optic material is then adjusted so that the spectrum of the optical pulse falls on one edge (preferably at the 50% transmission point) of the transmission window. The electrical field then changes the optical path (the product of the refractive index and cavity thickness), by either changing the thickness or refractive index of the FP. The electro-optic material is preferably an electro-optic material that exhibits a strong pockels effect or a piezo-electric polymer oriented so that its rotational axis of symmetry (c-axis) is aligned with the E-vector of the electric field being sampled. The reflectivity of the FP, the thickness of the thin film which defines the FP cavity and the uniformity of the index is such that the finesse of the FP is high (suitably of the order of 10-100), and the sensitivity of the electro-optic modulator (the electro optic effect therein) is enhanced by an amount equal to the finesse.
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Lukacher Martin
The University of Rochester
Tokar Michael J.
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