Radiant energy – Inspection of solids or liquids by charged particles
Patent
1992-07-17
1993-12-07
Berman, Jack I.
Radiant energy
Inspection of solids or liquids by charged particles
250307, 2041531, 204400, 204412, H01J 3728
Patent
active
052685730
ABSTRACT:
A microwave sweep oscillator is used to apply an AC signal cross a scanning tunneling microscope and the current or voltage passing between the electrodes is measured by a microwave spectrum
etwork analyze
REFERENCES:
"AC Scanning Tunneling Microscopy and Spectroscopy," by Stranick et al., Version Date Aug. 28, 1992.
"Near-Optics; Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit," by Betzig et al., Science, vol. 257, pp. 189-195, Jul. 10, 1992.
"Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale," by Betzig, et al., Science, vol. 251, pp. 1468-1470, Mar. 22, 1991.
"Super-Resolution Aperture Scanning Microscope," by Weiss, Nature, vol. 237, pp. 510-512, Jun. 10, 1972.
"Scanning Surface Harmonic Microscopy: Scanning Probe Microscopy Based on Microwave Field-Induced Harmonic Generation," by Michel et al., Rev. Sci. Instrum., 63(9):4080-4085, Sep. 1992.
G. Kochanski, "Nonlinear Alternating-Current Tunneling Microscopy," Physical Review Letters, 62(19):2285-2288 (May 8, 1989).
G. Kichanski, "Nonlinear Alternating-Current Tunneling Microscopy" (AT&T Preprint (Aug. 17, 1988), published in Physical Review Letters, 62 (19):2285-2288 (May 8, 1989).
W. Seifert et al., "Scanning Tunneling Microscopy At Microwave Frequencies," Ultramicroscopy 42-44; 379-387 (1992).
W. Seifert et al., [Preprint paper], "Scannning Tunneling Microscopy at Microwave Frequencies," Korrigierte Version (Nov. 6, 1991) published in Ultramicroscopy 42-44; 379-387 (1992).
D. Anselmetti et al., H.-J. Guntherodt R. Weisendanger (Eds.) "Scanning Tunneling Microscopy I," pp. 5-6.
L. Arnold et al., "Laser-Frequency Mixing Using the Scanning Tunneling Microscope," J. Vac. Sci. Technol., A, 6(2): 466-469 (Mar./Apr., 1988).
L. Arnold et al., "Laser-Frequency Mixing in the Junction of a Scanning Tunneling Microscope," Appl. Phys. Lett., 51(11):786-788 (Sep. 14, 1987).
M. Volcker et al., "Laser-Driven Scanning Tunneling Microscope," Phys. Rev. Lett., 66(13):1717-1720 (Apr. 1, 1991).
D. Cahill et al., "Scanning Tunneling Microscopy of Photoexcited Carriers at the Si(001) Surface," J. Vac. Sci. Technol., B, 9(2):564-567 (Mar./Apr. 1991).
R. Hamers et al., "Atomically Resolved Carrier Recombination at Si (111)--(7.times.7) Surfaces," Phys. Rev. Lett., 64(9):1051-1054 (Feb. 26, 1990).
Y. Kuk et al., "Optical Interactions in the Junctio of a Scanning Tunneling Microscope," Phys. Rev. Lett., 65(4):456-459 (1990).
Y. Kuk et al., "Optical Interactions in the Junction of a Scanning Tunneling Microscope," [Preprint] published in Phys. Rev. Lett., 65(4):456-459 (1990).
K. Likharev, "Correlated Discrete Transfer of Single Electrons in Ultrasmall Tunnell Junctions," IBM J. Res. Develop., 32(1):144-158 (Jan. 1988).
K. Likharev et al., "Single Electronics," Scientific American, Jun. 1992.
C. Andrieux et al., "Ultramicroelectrodes: Cyclic Voltammetry Above One Million V s.sup.1 ", J. Electroanal. Chem., 248:447-450 (1988).
R. Wightman et al., "High-Speed Cyclic Voltammetry," Acc. Chem. Res., 23:64-70 (1990).
Stranick Stephan J.
Weiss Paul S.
Berman Jack I.
Penn State Research Foundation and Biotechnology Research
The Penn State Research Foundation
LandOfFree
System for detecting threshold phenomena associated with and/or does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for detecting threshold phenomena associated with and/or , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for detecting threshold phenomena associated with and/or will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2017636