Coating apparatus – Gas or vapor deposition – With treating means
Reexamination Certificate
2008-05-27
2008-05-27
McDonald, Rodney G. (Department: 1795)
Coating apparatus
Gas or vapor deposition
With treating means
C250S492100, C250S492200, C250S492210, C250S492220, C250S492230, C250S492300
Reexamination Certificate
active
10667006
ABSTRACT:
System and method of gas-cluster ion beam processing is realized by incorporating improved beam and workpiece neutralizing components. Larger GCIB current transport is enabled by low energy electron neutralization of space charge of the GCIB. The larger currents transport greater quantities of gas in the GCIB. A vented faraday cup beam measurement system maintains beam dosimetry accuracy despite the high gas transport load.
REFERENCES:
patent: 4361762 (1982-11-01), Douglas
patent: 4916311 (1990-04-01), Fuzishita et al.
patent: 5814194 (1998-09-01), Deguchi et al.
patent: 5959305 (1999-09-01), Mack et al.
patent: 6331227 (2001-12-01), Dykstra et al.
patent: 6486478 (2002-11-01), Libby et al.
patent: 6613240 (2003-09-01), Skinner et al.
patent: 6723998 (2004-04-01), Bisson et al.
patent: 2002/0130275 (2002-09-01), Mack et al.
patent: 02-144841 (1990-06-01), None
patent: 2000065942 (2000-03-01), None
patent: WO 02/052608 (2002-07-01), None
Forrester, A. Theodore, Large Ion Beams, pp. 33-41, John Wiley & Sons, NY, 1988.
Burns & Levinson LLP
Cohen Jerry
Gomes David W
McDonald Rodney G.
TEL Epion Inc.
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