System for and method of controlling a VLSI environment

Details System for and method of controlling a VLSI environment System for and method of controlling a VLSI environment

2003-08-20

2011-10-11

Whitmore, Stacy (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Testing or evaluating

C714S010000, C714S022000, C713S320000, C374S141000

Reexamination Certificate

active

08037445

ABSTRACT:
An apparatus comprising an integrated circuit on a VLSI die, and an embedded micro-controller constructed on the VLSI die, the micro-controller adapted to monitor and control the VLSI environment to optimize the integrated circuit operation. Another embodiment of the invention is directed to a method for monitoring and controlling an integrated circuit comprising providing an embedded micro-controller on a same VLSI die as the integrated circuit, monitoring and controlling a VLSI environment of the integrated circuit with the embedded micro-controller.

REFERENCES:
patent: 6908227 (2005-06-01), Rusu et al.
patent: 6948082 (2005-09-01), Gschwind et al.
U.S. Appl. No. 10/644,559, C. J. Bostak, et al.
U.S. Appl. No. 10/644,376, C. A. Poirier et al.
U.S. Appl. No. 10/644,542, C. J. Bostak, et al.

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