System for analyzing surfaces of samples

Details System for analyzing surfaces of samples System for analyzing surfaces of samples

1995-12-22

1997-04-08

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

H01J 3728

Patent

active

056190352

ABSTRACT:
A system for transporting in a vacuum chamber sample holders and samples between a holder tray and a location for use with a surface analytical instrument is disclosed. Also provided is a system including a microwave coaxial cable connecting the tip terminal of a scanning tunneling microscope to a microwave signal source and a system for clamping a heater to a sample holder in order to heat the sample.

REFERENCES:
patent: 3566262 (1971-02-01), Thompson et al.
patent: 3958124 (1976-05-01), Koch et al.
patent: 4491753 (1990-07-01), Wickramasinghe
patent: 4939363 (1990-07-01), Bando
patent: 4992660 (1991-02-01), Kobayashi
patent: 5060248 (1991-10-01), Dumoulin
patent: 5103095 (1992-04-01), Elings et al.
patent: 5130554 (1992-07-01), Nose et al.
patent: 5247181 (1993-09-01), Oonuki et al.
patent: 5268573 (1993-12-01), Weiss et al.
patent: 5281814 (1994-01-01), Weiss et al.
patent: 5397896 (1995-03-01), Weiss et al.
patent: 5504366 (1996-04-01), Weiss et al.
"AC Scanning Tunneling Microscopy and Spectroscopy," Stranick et al., Version Date Aug. 28, 1992.
"Near-Field Optics: Microscopy Spectroscopy, and Surface Modification Beyond . . . ," Betzig et al., Science, V. 25, pp. 189-195, Jul. 10, 1992.
"Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale," Betzig et al., Science, V.251, pp. 1468-1470, Mar. 22, 1991.
"Super-Resolution aperture Scanning Microscope," Weiss, Nature, V. 237, pp. 510-512, Jun. 10, 1972.
"Scanning Surface Harmonic Microscopy: Scanning Probe Microscopy . . . ," Michel et al., Rev. Sci. Instrum., V. 63, No. 9, pp. 4080-4085, Sep. 1992.
"Nonlinear Alternating-Current Tunneling Microscopy," Kochanski, Physical Reivew Letters, 62(19):2285-2288 (May 8, 1989).
"Nonlinear Alternating-Current Tunneling Microscopy" (AT&T Preprint (Aug. 17, 1988)), published in Phys. Rev. Ltrs., 62(19):2285-2288 (May 8, 1989).
"Scanning Tunneling Microscopy at Microwave Frequencies," Ultramicroscopy, Siefert et al., pp. 42-44; 379-387 (1992).
"Scanning Tunneling Microscopy at Microwave Frequencies," Ultramicroscopy, (Preprint, Korrigierte Version, Nov. 6, 1991), Siefert et al., pp. 42-44; 379-387 (1992).
"Scanning Tunneling Microscopy I," Anselmetti et al., pp. 5-6.
"Laser-Frequency Mixing Using the Scanning Tunneling Microscopy," Arnold et al., J. Vac. Sci. Technol., A, 6(2):466-469 (Mar./Apr. 1988).
"Laser-Frequency Mixing in the Junction of a Scanning Tunneling Microscopy," Appl. Phys. Lett., 51(11)786-788 (Sep. 14, 1987), Arnold et al.
"Laser-Driven Scanning Tunneling Microscope," Volcker et al., Phys. Rev. Ltrs., 66(13)1717-1720 (Apr. 1, 1991).
"Scanning Tunneling Microscopy of Photoexcited Carriers at the Si(001) Surface," Chahill et al., J. Vac. Sci. Techn., B, 9(2):564-567 (Mar./Apr. 1991).
"Atomically Resolved Carrier Recombination at Si(111)-(7.times.7) Surfaces," Hamers et al., Phys. Rev. Lett., 64(9):1051-1054 (Feb. 26, 1990).
"Optical Interactions in the Junction of a Scanning Tunneling Microscope," Kuk et al., Phys. Rev. Lett., 65(4):456-459 (1990).
"Optical Interactions in the Junction of a Scanning Tunneling Microscope," Kuk et al., Preprint pub. in Phys. Rev. Lett., 65(4):456-459 (1990).
"Correlated Discrete Transfer of Singel Electrons in Ultrasmall Tunnel Junctions", Likharev, IBM J. Res. Develop., 32(1)144-158 (Jan. 1988).
"Single Electronics," Likharev et al., Scientific American, Jun. 1992.
"Ultramicreolectrodes: Cyclic Molammetry Above One Million Vs," J. Electro anal. Chem., 248:447-450 (1988).
"High-Speed Cyclic Voltammetry," Wightman et al., Acc. Chem. Res., 23:64-70 (1990).
"Single Charge Tunneling Coulomb Blockade Phenomena . . . ," Grabert et al., NATO ASI Series, Series B: Physics, vol. 294, pp. 1-19, 1992.
"Time-Correlated Single-Electron Tunneling on One-Dimensional Arrays of Ultrasmall . . . ", Delsing et al., Phys. Rev. Lett., 63(17):1861-1864, Oct. 23, 1989.
"Imaging C.sub.60 clusters on a surface using a scanning tunneling microscope", Wilson et al. Nature, vol. 348, Dec. 13, 1990, pp. 621-622.
"A Versatile Microwave-Frequency Compatible Scanning Tunneling Microscope," Stranick et al., Rev. Sci. Instrum., 64(5):1232-1234, May 1993.
"Coarse Tip Distance Adjustment and Positioner for a Scanning Tunneling Microscope", Frohn et al., Rev. Sci. Instrum., 60:1200-1201, Jun. 1989.
"Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications", edited by Binh et al., NATO ASI Series, V. 235, pp. 19-33.
Product brochure entitled "The Beetle STM-A Versatile, UHV Compatible Scanning Tunneling Microcope".
"An Easily Operable Scaning Tunneling Microscope", Besocke, Surface Science, 181:145-153, 1987.
Product brochure entitled "Surface/Interface Components Overview", Instruments and Materials for Surface and Interface Analysis, Mountain View, CA.
"Generation of Microwave Radiation in the Tunneling Junction of a Scanning Tunneling Microscope", by Krieger et al., The American Physical Society, vol. 41, No. 14, May 15, 1990, pp. 10229-10232.
"A New Impedance Spectrometer for the Investigation of Electrochemical Systems", by Popkirov et al. Rev. Sci. Instrum., vol. 63, No. 11, pp. 5366-5372.
"Scanning Tunneling Microscopy, Resonant Tunneling, and Counting Electrons: A Quantum Standard of Current," By Guinea et al., Physical Review Letters, vol. 65, No. 3, pp. 281-284, Jul. 16, 1990.
"A Tunable Microwave Frequency Alternating Current Scanning Tunneling Microscoper," by Stranick et al., Review of Scientific Instruments, vol. 65, No. 4, Apr. 1994, New York, pp. 918-921.
"A Novel Ultrahigh Vacuum Scanning Tunneling Microscope for Surface Science Studies," by Haase et al., Review of Scientific Instruments, vol. 61, No. 5, May 1990, New York, pp. 1480-1483.

Affiliated with

Also associated with

Rating

System for analyzing surfaces of samples does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for analyzing surfaces of samples, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for analyzing surfaces of samples will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2399095