Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-07-26
2005-07-26
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
06922819
ABSTRACT:
Component values and/or sizes in an electrical circuit are optimized with waveform shaping considerations in addition to other constraints and/or objective functions such as delay, power, gain, area or rise/fall times. A consistent metric is defined as a quality measure of waveform match. Gradients of these metrics are computed by efficient methods, thus enabling mathematical optimization by a numerical optimizer. Two different useful metrics and the corresponding efficient gradient computation techniques are described.
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Law Office of Charles W. Peterson, Jr.
Lin Sun James
Percello Louis J.
Whitmore Stacy A.
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