System and method of criticality prediction in statistical...

Details System and method of criticality prediction in statistical... System and method of criticality prediction in statistical...

2005-12-16

2008-10-14

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

07437697

ABSTRACT:
A method for determining criticality probability of an edge of a timing graph of a circuit is described. The method includes forming a directed acyclic timing graph corresponding to a circuit being timed, performing statistical timing of the circuit, for each edge of interest, defining a cutset that divides the timing graph into a plurality of parts, determining an edge slack for each edge in the cutset, computing a statistical maximum of all edge slacks in the cutset, and inferring edge criticality probabilities of each edge from the statistical maximum. A system for determining criticality probability of an edge of a timing graph of a circuit is also described.

REFERENCES:
patent: 5365463 (1994-11-01), Donath et al.
patent: 2004/0002844 (2004-01-01), Jess et al.
patent: 2004/0243954 (2004-12-01), Devgan et al.
patent: 2005/0065765 (2005-03-01), Visweswariah et al.
patent: 2005/0066296 (2005-03-01), Visweswariah et al.
patent: 2007/0113211 (2007-05-01), Zhang et al.
Visweswariah C et al: “First -order . . . ” Design Automation Conference, 2004 . Jun. 7, 2004, pp. 331-336.
Guthaus M R et al: “Gate sizing . . . ” Computer-Aided Design, 2005. Nov. 6, 2005, pp. 1026-1033.
Agarwal A et al: “Circuit optimization . . . ” Design Automation Conference, 2005. Jun. 13, 2005, pp. 321-324.
Chopra K et al: “Parametic yield maximization . . . ” Computer-Aided Design, 2005. Nov. 6, 2005, pp. 1023-1028.
Jinjun Xiong et al: “Critically computation . . . ” Design Automation Conference, 2006. Jul. 24, 2006, pp. 63-68.
Chang H et al: “Parameterized block-based . . . ” Design Automation Conference, 2005. Jun. 13, 2005, pp. 71-76.

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