Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source
Reexamination Certificate
2006-02-28
2006-02-28
Porta, David (Department: 2878)
Radiant energy
Inspection of solids or liquids by charged particles
Including a radioactive source
Reexamination Certificate
active
07005639
ABSTRACT:
Beta gauge composition correction is performed using signals from a plurality of detectors that are positioned so that the ratio of radiation received by the detectors depends on the composition of material through which the radiation passes before reaching the detectors. Radiation is measured at the detectors and the differences between radiation received by the detectors is used to compensate the beta gauge to correct for composition variations. An array of detectors is divided into inner detectors generally aligned with the central portion of a beta radiation beam and at least one set of outer detectors surrounding, at least in part, the inner detectors. Measurements are made including all the detectors, the inner detectors and the at least one set of outer detectors with the difference between the measurements made by the inner detectors and the outer detectors being used to compensate the total measurement made by all the detectors.
REFERENCES:
patent: 2988641 (1961-06-01), Gough
patent: 3087061 (1963-04-01), Dukes et al.
patent: 3210545 (1965-10-01), Bennett
patent: 4047029 (1977-09-01), Allport
patent: 5099504 (1992-03-01), Pettit
patent: 5233195 (1993-08-01), Hellstrom et al.
patent: 5778041 (1998-07-01), Chase et al.
patent: 5854821 (1998-12-01), Chase et al.
patent: 6498646 (2002-12-01), Typpo et al.
patent: 2004/0155196 (2004-08-01), Typpo
patent: 1 447 659 (2004-08-01), None
patent: WO 94/29700 (1994-12-01), None
Steven P. Sturm; A new generation of beta gauges; Papex International Conference; Nov. 1993; Maastricht Netherlands.
ABB Inc.
Stevens & Showalter LLP
Vu Mindy
LandOfFree
System and method of composition correction for beta gauges does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method of composition correction for beta gauges, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method of composition correction for beta gauges will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3642050