Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-02-08
2005-02-08
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06854102
ABSTRACT:
The method of the present invention acquires delay, setup and hold values that appropriately reflect the timing characteristics of an integrated circuit represented by a cell file. A data and clock input slope pair is selected and the data setup time value is swept with respect to the clock. For each setup value a corresponding hold value is determined for functional failure. Then for each setup and hold value pair a delay value is ascertained. In one exemplary implementation optimal delay, setup and hold values are determined and utilized to facilitate higher frequency designs using the same physical cell layout library.
REFERENCES:
patent: 5555187 (1996-09-01), Spyrou
patent: 5740347 (1998-04-01), Avidan
Bowers Brandon
Cypress Semiconductor Corporation
Garbowski Leigh M.
Wagner , Murabito & Hao LLP
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