Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-01-23
2007-01-23
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10977982
ABSTRACT:
A system for verifying trace distances of a PCB layout includes a computer (10) and a database (11). The computer includes: a segment receiving module (100) for receiving segments of a selected trace, and depositing the segments in a segment set; a segment selecting module (101) for selecting an unverified segment from the segment set; a distance setting module (102) for setting a searching distance; an area ascertaining module (103) for ascertaining a rectangular area; a segment searching module (104) for searching segments of other traces in the rectangular area; a distance calculating module (105) for calculating a distance between the unverified segment and each searched segment; a distance comparing module (106) for comparing the calculated distances to obtain a shortest distance, and comparing the shortest distance with a preset benchmark distance; and a verification determining module (107) for determining whether all segments of the selected trace has been verified.
REFERENCES:
patent: 5247455 (1993-09-01), Yoshikawa
patent: 5383132 (1995-01-01), Shinohara et al.
patent: 6316944 (2001-11-01), Barnette et al.
patent: 6718529 (2004-04-01), Iwanishi
patent: 6799306 (2004-09-01), Araki et al.
patent: 7117459 (2006-10-01), Tanimoto et al.
Garbowski Leigh M.
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( Shenzhen) Co., Ltd.
Morris Manning & Martin LLP
Tingkang Xia, Esq. Tim
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