Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-15
2007-05-15
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10977823
ABSTRACT:
A system for verifying a layout of circuit traces on a motherboard includes a computer (1) and a database (2). The database is used for storing data generated and used by the system. The computer includes: a substandard layout area creating module (101) for creating substandard layout areas; a substandard segment data obtaining module (102) for obtaining from the database actual layout data on substandard segments placed in the substandard areas; a substandard length calculating module (103) for calculating a total length of all the substandard segments of a trace; and a satisfactory trace determining module (104) for comparing the total length of the substandard segments of the trace with a preset standard length for the trace, and determining whether the trace is satisfactory. A related method is also disclosed.
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Lin Yu-Long
Peng Jie
Wu Hao
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( Shenzhen) Co., Ltd.
Kik Phallaka
Morris Manning & Martin LLP
Tingkang Xia, Esq. Tim
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