Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-08-29
2006-08-29
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07100144
ABSTRACT:
A system for topology selection to minimize leakage power during synthesis, wherein the system is configured to receive a circuit model that has one or more circuit gates. The system is further configured to receive a library having one or more logic gates, wherein each logic gate has a topology and the leakage sensitivities for each of the topologies is calculated. The system is then configured to synthesize a new circuit model by selecting one or more of the topologies based on its leakage sensitivities, wherein the new circuit model has reduced current leakage.
REFERENCES:
patent: 6345379 (2002-02-01), Khouja et al.
patent: 2002/0144223 (2002-10-01), Usami et al.
patent: 2003/0126579 (2003-07-01), Whitaker et al.
patent: 2005/0044515 (2005-02-01), Acar et al.
Jacobson Hans M.
Kudva Prabhakar N.
Sigal Leon J.
Dinh Paul
F. Chau & Associates LLC
International Business Machines - Corporation
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