System and method for thermal processing of a semiconductor subs

Electric heating – Heating devices – Combined with container – enclosure – or support for material...

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219405, 219390, 392416, 432120, 432202, H05B 368

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active

060464399

ABSTRACT:
A semiconductor substrate processing system and method using a stable heating source with a large thermal mass relative to conventional lamp heated systems. The system dimensions and processing parameters are selected to provide a substantial heat flux to the wafer while minimizing heat loss to the surrounding environment (particularly from the edges of the heat source and wafer). The heat source provides a wafer temperature uniformity profile that has a low variance across temperature ranges at low pressures. A resistively heated block is substantially enclosed within an insulated vacuum cavity used to heat the wafer. Insulating walls comprising a reflective material, such as polished tungsten, encapsulated within an inert insulating material, such as quartz, may be used to provide insulation. The isothermal nature of the processing region may be enhanced by using multiple layers of insulating walls, actively heated insulating walls or a conductive gas to enhance heat transfer to the semiconductor substrate. A semiconductor substrate may be heated and cooled in stages in the processing system to avoid slip. Proximity, conductive gases and cooling gases may be used to increase or decrease the level of heating in stages.

REFERENCES:
patent: 3293074 (1966-12-01), Nickl
patent: 4010690 (1977-03-01), Cocozella et al.
patent: 4555273 (1985-11-01), Collins et al.
patent: 4641603 (1987-02-01), Miyazaki et al.
patent: 4649261 (1987-03-01), Sheets
patent: 4698486 (1987-10-01), Sheets
patent: 4770630 (1988-09-01), Akimoto et al.
patent: 4794217 (1988-12-01), Quan et al.
patent: 4823735 (1989-04-01), Pichel et al.
patent: 4857689 (1989-08-01), Lee
patent: 4909314 (1990-03-01), Lamont, Jr.
patent: 4914276 (1990-04-01), Blair
patent: 5001327 (1991-03-01), Hirasawa et al.
patent: 5011794 (1991-04-01), Grim et al.
patent: 5060354 (1991-10-01), Chizinsky
patent: 5062386 (1991-11-01), Christensen
patent: 5119761 (1992-06-01), Nakata
patent: 5252131 (1993-10-01), Kiyama et al.
patent: 5252807 (1993-10-01), Chizinsky
patent: 5429498 (1995-07-01), Okase et al.
patent: 5430271 (1995-07-01), Orgami et al.
patent: 5440132 (1995-08-01), Joyner et al.
patent: 5462603 (1995-10-01), Murakami
patent: 5651827 (1997-07-01), Aoyama et al.
patent: 5660472 (1997-08-01), Peuse et al.
patent: 5680502 (1997-10-01), Kim
patent: 5695564 (1997-12-01), Imahashi
patent: 5830277 (1998-11-01), Johnsgard et al.
D. Aitken et al., "A New VLSI Compatible Rapid Thermal Processing System," Nucl. Instrum. Meth. Phys. Res. B21, at 622-626 (1987).
R. T. Fulks et al., "Rapid isothermal annealing of ion implantation damage using a thermal radiation source," Appl. Phys. Lett. 39(8), Oct. 15, 1981, pp. 604-606.
Opaque Quartzglass Quartzglass OM-100, General Product Description, PCI-C 20-E, May 1994, Haraeus Quarzglas GmbH, Germany.
L. Peters, "The Hottest Topic in RTP," Semiconductor International, Aug. 1991, pp. 56-62.
F. Roozeboom, "Manufacturing Equipment Issues in Rapid Thermal Processing," Rapid Thermal Processing Science and Technology, Academic Press, pp. 349-423.

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