Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2007-01-30
2007-01-30
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C324S765010, C702S081000, C702S108000, C707S793000
Reexamination Certificate
active
11019065
ABSTRACT:
According to one embodiment, a method of analyzing semiconductor test data includes receiving a plurality of raw data entries from a testing system. Each raw data entry is associated with a test structure of a semiconductor device, and each raw data entry is uniquely identified by a name including a plurality of parseable fields. The plurality of data entries is parsed using a selected one of the plurality of parseable fields to identify a grouping of raw data entries. At least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries is calculated, and the at least one reportable parameter is provided to a user.
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patent: 6513043 (2003-01-01), Chan et al.
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Donnelly Emily A.
Jones-Williams Pamula Jean
Liu Jin
Wang Jianglin
Brady III W. James
Bui Bryan
Le John
McLarty Peter K.
Telecky , Jr. Frederick J.
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