System and method for the analysis of semiconductor test data

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S765010, C702S081000, C702S108000, C707S793000

Reexamination Certificate

active

11019065

ABSTRACT:
According to one embodiment, a method of analyzing semiconductor test data includes receiving a plurality of raw data entries from a testing system. Each raw data entry is associated with a test structure of a semiconductor device, and each raw data entry is uniquely identified by a name including a plurality of parseable fields. The plurality of data entries is parsed using a selected one of the plurality of parseable fields to identify a grouping of raw data entries. At least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries is calculated, and the at least one reportable parameter is provided to a user.

REFERENCES:
patent: 4967381 (1990-10-01), Lane et al.
patent: 5726920 (1998-03-01), Chen et al.
patent: 6513043 (2003-01-01), Chan et al.
patent: 6717431 (2004-04-01), Rathei et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for the analysis of semiconductor test data does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for the analysis of semiconductor test data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for the analysis of semiconductor test data will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3789610

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.