System and method for testing an embedded system

Details System and method for testing an embedded system System and method for testing an embedded system

2008-08-25

2010-11-23

Beausoliel, Jr., Robert W. (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S025000, C714S026000, C714S048000

Reexamination Certificate

active

07840843

ABSTRACT:
A testing system for an embedded system is provided. The testing system includes a plurality of devices and one or more host computers. Each device, which includes the embedded system to be tested, is connected to the host computer via a network based on the network file system protocol. The host computers are further connected with a control server, and each of the host computers comprises a root file system. The control server is configured for providing an interface for a user to set test parameters, controlling each of the host computers to invoke a test program, thereby testing the embedded system according to the test parameters, and receiving test results of the embedded system from the host computer. A related testing method is also provided.

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patent: 7152027 (2006-12-01), Andrade et al.
patent: 2007/0011522 (2007-01-01), Denniston
patent: 2008/0128715 (2008-06-01), Williams et al.
patent: 1967498 (2007-05-01), None
patent: 10-2006-0062939 (2006-06-01), None
patent: 10-2006-0066578 (2006-06-01), None

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