System and method for testing a data storage device without...

Details System and method for testing a data storage device without... System and method for testing a data storage device without...

2007-06-05

2007-06-05

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C726S002000

Reexamination Certificate

active

11098496

ABSTRACT:
A system and method for testing a data storage device without revealing memory content. To control the individual bits of the memory during testing each value is written into the memory according to the equationin-line-formulae description="In-line Formulae" end="lead"?NEW_DATA=CURRENT_DATA XOR DATA_SEEDin-line-formulae description="In-line Formulae" end="tail"?such that individual bits of NEW_DATA are equal to CURRENT_DATA with selected bits inverted when the corresponding positions in DATA_SEED are high. NEW_DATA is written into the memory, read out and verified, so that all bit positions can be controlled and tested in both logic states, while NEW_DATA and CURRENT_DATA are not ascertainable by the testing software.

REFERENCES:
patent: 4864615 (1989-09-01), Bennett et al.
patent: RE36181 (1999-04-01), Koopman et al.
patent: 6324287 (2001-11-01), Angert
patent: 2005/0154953 (2005-07-01), Norskog

Affiliated with

Also associated with

Rating

System and method for testing a data storage device without... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for testing a data storage device without..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for testing a data storage device without... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3873212