System and method for signal integrity testing of electronic...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

11054806

ABSTRACT:
A system and method are disclosed for measuring signal crosstalk in an electronic circuit device or Integrated Circuit (IC) device, correlating the results with modeled information, and accurately identifying one or more levels of coupling noise in the device. For example, a system is disclosed that provides data on levels of crosstalk between conductive lines in a device. The system uses programmable victim and aggressor lines, programmable drive capability, and programmable loading through one or more known crosstalk structures to compare an output signal with a reference signal and accurately identify one or more levels of coupling noise in the device.

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Attarha et al., Signal Integrity Fault Analysis Using Reduced-Order Modeling, Annual ACM IEEE Design Automation Conference, Proceedings of the 39thConference on Design Automation in New Orleans, Jun. 10-14, 2002, p. 4, Publisher: DAC.

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