System and method for removing particles in semiconductor...

Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...

Reexamination Certificate

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C134S001300, C438S706000

Reexamination Certificate

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07819980

ABSTRACT:
A system for semiconductor wafer manufacturing, comprises a chamber process path for processing the wafer, and a device operable to remove particles from the wafer by electrostatic and electromagnetic methodologies wherein the device is installed in the chamber process path.

REFERENCES:
patent: 5350428 (1994-09-01), Leroux et al.
patent: 5584938 (1996-12-01), Douglas
patent: 6486072 (2002-11-01), Phan et al.
patent: 6500268 (2002-12-01), Henley
patent: 2003/0184720 (2003-10-01), Heerens et al.

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