Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2005-12-27
2005-12-27
Bahta, Kidest (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S121000, C700S223000
Reexamination Certificate
active
06980873
ABSTRACT:
A system and method for detecting a fault and identifying a remedy for the fault in real-time in a semiconductor product manufacturing facility are provided. In one example, the method includes importing data from a manufacturing device and data representing a plurality of different manufacturing devices into an analysis tool. The imported data is analyzed using the analysis tool to determine if a fault exists in the manufacturing device's operation and, if a fault exists, the fault is classified and a remedy for the fault is identified based at least partly on the classification. Configuration data used to control the manufacturing device may be updated, and the update may apply the remedy to the configuration information. The manufacturing device's operation may then be modified using the updated configuration data.
REFERENCES:
patent: 5231585 (1993-07-01), Kobayashi et al.
patent: 5610903 (1997-03-01), Crayford
patent: 5859964 (1999-01-01), Wang et al.
patent: 6018808 (2000-01-01), Schieve
patent: 6133132 (2000-10-01), Toprac et al.
patent: 6245581 (2001-06-01), Bonser et al.
patent: 6263255 (2001-07-01), Tan et al.
patent: 6294472 (2001-09-01), Smith et al.
patent: 6304999 (2001-10-01), Toprac et al.
patent: 6335286 (2002-01-01), Lansford
patent: 6337217 (2002-01-01), Hause et al.
patent: 6346426 (2002-02-01), Toprac et al.
patent: 6351684 (2002-02-01), Shirley et al.
patent: 6352870 (2002-03-01), Lansford
patent: 6360133 (2002-03-01), Campbell et al.
patent: 6362116 (2002-03-01), Lansford
patent: 6365422 (2002-04-01), Hewett et al.
patent: 6368184 (2002-04-01), Beckage
patent: 6368883 (2002-04-01), Bode et al.
patent: 6368884 (2002-04-01), Goodwin et al.
patent: 6376261 (2002-04-01), Campbell
patent: 6383824 (2002-05-01), Lensing
patent: 6383888 (2002-05-01), Stirton
patent: 6387823 (2002-05-01), Sonderman et al.
patent: 6405096 (2002-06-01), Toprac et al.
patent: 6405144 (2002-06-01), Toprac et al.
patent: 6409879 (2002-06-01), Toprac et al.
patent: 6410351 (2002-06-01), Bode et al.
patent: 6427093 (2002-07-01), Toprac
patent: 6442496 (2002-08-01), Pasadyn et al.
patent: 6444481 (2002-09-01), Pasadyn et al.
patent: 6448099 (2002-09-01), Iacoponi et al.
patent: 6449524 (2002-09-01), Miller et al.
patent: 6451700 (2002-09-01), Stirton et al.
patent: 6458605 (2002-10-01), Stirton
patent: 6458610 (2002-10-01), Lensing et al.
patent: 6460002 (2002-10-01), Bone et al.
patent: 6461878 (2002-10-01), Lansford
patent: 6465263 (2002-10-01), Coss, Jr. et al.
patent: 6470230 (2002-10-01), Toprac et al.
patent: 6479200 (2002-11-01), Stirton
patent: 6479309 (2002-11-01), Wright
patent: 6480854 (2002-11-01), Gross et al.
patent: 6484064 (2002-11-01), Campbell
patent: 6485990 (2002-11-01), Lansford
patent: 6486036 (2002-11-01), Miethke et al.
patent: 6509201 (2003-01-01), Wright
patent: 6511898 (2003-01-01), Sonderman et al.
patent: 6512991 (2003-01-01), Davis et al.
patent: 6524163 (2003-02-01), Stirton
patent: 6524774 (2003-02-01), Sonderman
patent: 6528331 (2003-03-01), Bode et al.
patent: 6529282 (2003-03-01), Stirton et al.
patent: 6529789 (2003-03-01), Campbell et al.
patent: 6532428 (2003-03-01), Toprac
patent: 6532555 (2003-03-01), Miller et al.
patent: 6534328 (2003-03-01), Hewett et al.
patent: 6535774 (2003-03-01), Bode et al.
patent: 6535783 (2003-03-01), Miller et al.
patent: 6546508 (2003-04-01), Sonderman et al.
patent: 6549822 (2003-04-01), Toprac
patent: 6556881 (2003-04-01), Miller
patent: 6556882 (2003-04-01), Conboy et al.
patent: 6556884 (2003-04-01), Miller et al.
patent: 6556959 (2003-04-01), Miller et al.
patent: 6560503 (2003-05-01), Toprac et al.
patent: 6560506 (2003-05-01), Toprac
patent: 6562635 (2003-05-01), Lensing et al.
patent: 6563300 (2003-05-01), Jackson et al.
patent: 6567718 (2003-05-01), Campbell et al.
patent: 6569692 (2003-05-01), Bode et al.
patent: 6570228 (2003-05-01), Fuselier et al.
patent: 6571371 (2003-05-01), Coss, Jr. et al.
patent: 6576385 (2003-06-01), Bode et al.
patent: 6577914 (2003-06-01), Bode
patent: 6582618 (2003-06-01), Toprac et al.
patent: 6582863 (2003-06-01), Stirton et al.
patent: 6582975 (2003-06-01), Ryskoski
patent: 6588007 (2003-07-01), Pasadyn et al.
patent: 6589875 (2003-07-01), Bode et al.
patent: 6593227 (2003-07-01), Ryskoski
patent: 6594589 (2003-07-01), Coss, Jr. et al.
patent: 6595830 (2003-07-01), Hewett et al.
patent: 6597447 (2003-07-01), Stirton et al.
patent: 6599174 (2003-07-01), Spikes, Jr.
patent: 6605479 (2003-08-01), Pasadyn et al.
patent: 6607926 (2003-08-01), Toprac et al.
patent: 6610181 (2003-08-01), Besser et al.
patent: 6614540 (2003-09-01), Stirton
patent: 6615098 (2003-09-01), Bode et al.
patent: 6617258 (2003-09-01), Sonderman et al.
patent: 6618149 (2003-09-01), Stirton
patent: 6618640 (2003-09-01), Hittner et al.
patent: 6622059 (2003-09-01), Toprac et al.
patent: 6622061 (2003-09-01), Toprac et al.
patent: 6625512 (2003-09-01), Goodwin
patent: 6625514 (2003-09-01), Lensing
patent: 6629012 (2003-09-01), Riley et al.
patent: 6629879 (2003-10-01), Kim et al.
patent: 6630360 (2003-10-01), Christian et al.
patent: 6630362 (2003-10-01), Lensing
patent: 6632692 (2003-10-01), Hewett et al.
patent: 6640148 (2003-10-01), Miller et al.
patent: 6643008 (2003-11-01), Stirton et al.
patent: 6643557 (2003-11-01), Miller et al.
patent: 6645780 (2003-11-01), Sonderman et al.
patent: 6647309 (2003-11-01), Bone
patent: 6650435 (2003-11-01), Ikeda
patent: 6650957 (2003-11-01), Campbell et al.
patent: 6657716 (2003-12-01), Lensing et al.
patent: 6660539 (2003-12-01), Sonderman et al.
patent: 6660542 (2003-12-01), Stirton
patent: 6660543 (2003-12-01), Stirton et al.
patent: 6660651 (2003-12-01), Markle
patent: 6664013 (2003-12-01), Hewett et al.
patent: 6665623 (2003-12-01), Pasadyn et al.
patent: 6666754 (2003-12-01), Beckage
patent: 6675058 (2004-01-01), Pasadyn et al.
patent: 6677170 (2004-01-01), Markle
patent: 6678570 (2004-01-01), Pasadyn et al.
patent: 6684122 (2004-01-01), Christian et al.
patent: 6687561 (2004-02-01), Pasadyn et al.
patent: 6689521 (2004-02-01), Goodwin
patent: 6697153 (2004-02-01), Wright et al.
patent: 6697691 (2004-02-01), Miller et al.
patent: 6697696 (2004-02-01), Hickey et al.
patent: 6698009 (2004-02-01), Pasadyn et al.
patent: 6699727 (2004-03-01), Toprac et al.
patent: 6701206 (2004-03-01), Markle et al.
patent: 6706631 (2004-03-01), Fulford
patent: 6707562 (2004-03-01), Lensing
patent: 6708129 (2004-03-01), Pasadyn et al.
patent: 6709797 (2004-03-01), Bushman et al.
patent: 6716646 (2004-04-01), Wright et al.
patent: 6721616 (2004-04-01), Ryskoski
patent: 6725121 (2004-04-01), Pasadyn et al.
patent: 6725402 (2004-04-01), Coss, Jr. et al.
patent: 6763130 (2004-07-01), Somekh et al.
patent: 6834213 (2004-12-01), Sonderman et al.
patent: 2002/0099464 (2002-07-01), O'Connor et al.
Coss Jr., “Architecture for Automated Large Scale Fault Detection and Classification: A Breakthrough Design”, Nov. 14, 2002; 12 pgs., Advanced Micro Devices, Inc.
Goodlin, Brian E., et al., “Simultaneous Fault Detection and Classification for Semiconductor Manufacturing Tools”, 201stMeeting of the Electrochemical Society, International Symposium on Plasma Processing XIV, May 2002, 16 pages.
Bahta Kidest
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
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