Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-06-14
2005-06-14
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C700S108000
Reexamination Certificate
active
06907379
ABSTRACT:
A system and method are provided for processing tester information including means of determining axis information and means of determining break information for the tester information. The axis information and the break information are applied to the tester information to provide disjointed tester information. The disjointed tester information is then plotted on a disjointed axis graph.
REFERENCES:
patent: 5761064 (1998-06-01), La et al.
patent: 6480810 (2002-11-01), Cardella et al.
patent: 6532428 (2003-03-01), Toprac
patent: 6720194 (2004-04-01), Miller et al.
Shetty Shivananda S.
Wu Franklyn Shihyu
Advanced Micro Devices , Inc.
Baran Mary Catherine
Hoff Marc S.
Ishimaru Mikio
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