System and method for polishing and planarizing...

Abrading – Abrading process – Glass or stone abrading

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C451S057000, C451S285000

Reexamination Certificate

active

06869337

ABSTRACT:
A system and method for polishing semiconductor wafers includes a variable partial pad-wafer overlap polisher having a reduced surface area, fixed-abrasive polishing pad and a polisher having a non-abrasive polishing pad for use with an abrasive slurry. The method includes first polishing a wafer with the variable partial pad-wafer overlap polisher and the fixed-abrasive polishing pad and then polishing the wafer in a dispersed-abrasive process until a desired wafer thickness is achieved.

REFERENCES:
patent: 3589078 (1971-06-01), Bala et al.
patent: 4128968 (1978-12-01), Jones
patent: 4144099 (1979-03-01), Edmonds et al.
patent: 4197676 (1980-04-01), Sauerland
patent: 4232485 (1980-11-01), Eadon-Allen
patent: 4358338 (1982-11-01), Downey et al.
patent: 4462860 (1984-07-01), Szmanda
patent: 4693036 (1987-09-01), Mori
patent: 5177908 (1993-01-01), Tuttle
patent: 5245790 (1993-09-01), Jerbic
patent: 5265378 (1993-11-01), Rostoker
patent: 5310455 (1994-05-01), Pasch et al.
patent: 5321304 (1994-06-01), Rostoker
patent: 5389194 (1995-02-01), Rostoker et al.
patent: 5403228 (1995-04-01), Pasch
patent: 5441444 (1995-08-01), Nakajima
patent: 5508077 (1996-04-01), Chen et al.
patent: 5516400 (1996-05-01), Pasch et al.
patent: 5599423 (1997-02-01), Parker et al.
patent: 5624304 (1997-04-01), Pasch et al.
patent: 5632873 (1997-05-01), Stevens et al.
patent: 5645469 (1997-07-01), Burke et al.
patent: 5667433 (1997-09-01), Mallon
patent: 5672095 (1997-09-01), Morimoto et al.
patent: 5709593 (1998-01-01), Guthrie et al.
patent: 5736427 (1998-04-01), Henderson
patent: 5861055 (1999-01-01), Allman et al.
patent: 5865666 (1999-02-01), Nagahara
patent: 5868608 (1999-02-01), Allman et al.
patent: 5882251 (1999-03-01), Berman et al.
patent: 5888120 (1999-03-01), Doran
patent: 5893756 (1999-04-01), Berman et al.
patent: 5895270 (1999-04-01), Hempel, Jr.
patent: 5897426 (1999-04-01), Somekh
patent: 5913712 (1999-06-01), Molinar
patent: 5919082 (1999-07-01), Walker et al.
patent: 5948697 (1999-09-01), Hata
patent: 5957757 (1999-09-01), Berman
patent: 5964646 (1999-10-01), Kassir et al.
patent: 5969521 (1999-10-01), Kurita et al.
patent: 5972162 (1999-10-01), Cesna
patent: 5975991 (1999-11-01), Karlsrud
patent: 5975994 (1999-11-01), Sandhu et al.
patent: 6004193 (1999-12-01), Nagahara et al.
patent: 6004196 (1999-12-01), Doan et al.
patent: 6010538 (2000-01-01), Sun et al.
patent: 6030488 (2000-02-01), Izumi et al.
patent: 6041465 (2000-03-01), Yashiki et al.
patent: 6048259 (2000-04-01), Asai
patent: 6062954 (2000-05-01), Izumi
patent: 6066230 (2000-05-01), Arai
patent: 6068545 (2000-05-01), Arai
patent: 6074275 (2000-06-01), Yashiki et al.
patent: 6074277 (2000-06-01), Arai
patent: 6075606 (2000-06-01), Doan
patent: 6083082 (2000-07-01), Saldana
patent: 6093087 (2000-07-01), Hakomori et al.
patent: 6102784 (2000-08-01), Lichner
patent: 6106662 (2000-08-01), Bibby, Jr. et al.
patent: 6113478 (2000-09-01), Anderson, III et al.
patent: 6168508 (2001-01-01), Nagahara et al.
patent: 6220945 (2001-04-01), Hirokawa et al.
patent: 6328632 (2001-12-01), Chopra
patent: 6340326 (2002-01-01), Kistler et al.
patent: 6402588 (2002-06-01), Matsuo et al.
patent: 6431959 (2002-08-01), Mikhaylich et al.
patent: 6620725 (2003-09-01), Shue et al.
patent: 20020137436 (2002-09-01), Kistler et al.
patent: 0 150 074 (1985-07-01), None
patent: 0 180 175 (1986-05-01), None
patent: 0 272 531 (1988-06-01), None
patent: 0 272 531 (1988-06-01), None
patent: 0 337 379 (1989-10-01), None
patent: 0 754 525 (1997-01-01), None
patent: 0 916 452 (1999-05-01), None
patent: 0 992 322 (2000-04-01), None
patent: 1 057 591 (2000-12-01), None
patent: 2 324 750 (1998-11-01), None
patent: 7-111256 (1995-04-01), None
patent: 2000-015557 (2000-01-01), None
patent: WO 8203038 (1982-09-01), None
patent: WO 0053371 (2000-09-01), None
PCT Search Report dated Dec. 16, 2002 for corresponding PCT/US01/48658.
Copy of a Patent Abstracts of Japan, for Publication No. 05318325, Publication Date Mar. 12, 1993, “Grinding Wheel For Grinding Work And Its Electrolytic Dressing Method”, 1 page.
Copy of a Patent Abstracts of Japan, for Publication No. 2000015557, Publication Date Jan. 18, 2000, “Polishing Device”, 1 page.
Copy of International Search Report received for PCT application No. US01/01044, Filed on Jan. 12, 2001, date of mailing May 21, 2001, 8 pages.
Copy of Search Report for Application No. 01 988 320.6-1262 dated Apr. 29, 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for polishing and planarizing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for polishing and planarizing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for polishing and planarizing... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3378846

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.