Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-01-04
2011-01-04
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S014000
Reexamination Certificate
active
07865856
ABSTRACT:
A method of using a static performance analyzer that accepts as input a cell-level netlist, to perform static performance analysis on a circuit represented by a transistor level netlist. The method begins with converting said transistor-level netlist to a cell-level netlist by modeling individual transistors with a cell model. Then, a static performance analyzer is used to perform a static performance analysis of said cell-level netlist. Among performance characteristics that may be analyzed are timing (static timing analysis) and leakage power. The method described may also be used for statistical static timing and power analysis.
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Gupta Puneet
Kahng Andrew B.
Shah Saumil
Levin Naum B
Martine & Penilla & Gencarella LLP
Tela Innovations, Inc.
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