System and method for pattern recognition

Image analysis – Histogram processing – For setting a threshold

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382 30, 382 34, 382 50, G06K 968

Patent

active

044995954

ABSTRACT:
A system and method are disclosed for optically reading out one or more discrete line patterns from a pattern-carrying medium under a range of different conditions. The patterns may constitute alphanumeric characters arranged in serial alignment on the medium or a variety of other types of line patterns, or a single line pattern. In accordance with the present invention, the disclosed system is capable of successively reading out the patterns with a high degree of reliability, notwithstanding variations in their size, orientation and location, or variations in the color and reflectivity of the pattern-carrying medium surface. Further, the disclosed system and method are tolerant of the presence of blotches, scratches and other surface marks, and of irregularities in the otherwise uniform planar or curved surface of the medium. The invention is applicable to the readout of patterns that are printed on the surface, stamped or otherwise impressed onto it, or raised above it by embossing or the like.

REFERENCES:
patent: 3217294 (1965-11-01), Gerlach et al.
patent: 3278899 (1966-10-01), Shelton, Jr. et al.
patent: 3432673 (1969-03-01), Mader
patent: 3444517 (1969-05-01), Rabinow
patent: 3462737 (1969-08-01), Malaby
patent: 3484747 (1969-12-01), Nunley
patent: 3517167 (1970-06-01), Bell
patent: 3522585 (1970-08-01), LeMay
patent: 3559169 (1971-01-01), Gillman et al.
patent: 3576534 (1971-04-01), Steinberger
patent: 3581281 (1971-05-01), Martin
patent: 3596063 (1971-07-01), Curtis et al.
patent: 3601805 (1971-08-01), Snook
patent: 3614736 (1971-10-01), McLaughlin
patent: 3618016 (1971-11-01), Van Steenis
patent: 3629826 (1971-12-01), Cutaia et al.
patent: 3699536 (1972-10-01), Roberts
patent: 3706071 (1972-12-01), Gray
patent: 3710078 (1973-01-01), Lemelson
patent: 3713099 (1973-01-01), Hemstreet
patent: 3713100 (1973-01-01), Hemstreet
patent: 3717848 (1973-02-01), Irving et al.
patent: 3723970 (1973-03-01), Stoller
patent: 3735349 (1973-05-01), Beun et al.
patent: 3747066 (1973-07-01), Vernot et al.
patent: 3760355 (1973-09-01), Bruckert
patent: 3760356 (1973-09-01), Srivastava
patent: 4173015 (1979-10-01), Owens et al.
patent: 4244029 (1981-01-01), Hogan et al.
patent: 4250488 (1981-02-01), Haupt
patent: 4288782 (1981-09-01), Bader et al.
patent: 4308523 (1981-12-01), Schapira
patent: 3748644 (1973-07-01), Tisdale
patent: 3760162 (1973-09-01), Holter
patent: 3761876 (1973-09-01), Flaherty et al.
patent: 3784832 (1974-01-01), Sewell
patent: 3784981 (1974-01-01), Borowski, Jr. et al.
patent: 3792268 (1974-02-01), Bjerke et al.
patent: 3810162 (1974-05-01), Ewing, Jr. et al.
patent: 3816722 (1974-06-01), Sakoe et al.
patent: 3847346 (1974-11-01), Dolch
patent: 3870865 (1975-03-01), Schneiderhan et al.
patent: 3879708 (1975-04-01), Fryer et al.
patent: 3883848 (1975-05-01), Minck et al.
patent: 3921136 (1975-11-01), Bar-Lev
patent: 3937296 (1976-02-01), Jones et al.
patent: 3947817 (1976-03-01), Requa
patent: 3964022 (1976-06-01), Martin
patent: 4015240 (1977-03-01), Swonger et al.
patent: 4034343 (1977-07-01), Wilmer
patent: 4060713 (1977-11-01), Golay
patent: 4066998 (1978-01-01), Lidkea
patent: 4070584 (1978-01-01), Chartraire et al.
patent: 4072928 (1978-02-01), Wilder
patent: 4075605 (1978-02-01), Hilley et al.
patent: 4087790 (1978-05-01), Neff
patent: 4110737 (1978-08-01), Fahey
patent: 4119946 (1978-10-01), Taylor
patent: 4141492 (1979-02-01), Michel et al.
patent: 4153895 (1979-05-01), Weisbrod et al.
patent: 4204193 (1980-05-01), Schroeder
patent: 4230265 (1980-10-01), Gasaly
patent: 4243876 (1981-01-01), Engel et al.
patent: 4253768 (1981-03-01), Yaroshuk et al.
patent: 4266123 (1981-05-01), Friberg
patent: 4270863 (1981-06-01), Trogdon
patent: 4277775 (1981-07-01), Nalley et al.

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