Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-11-08
2005-11-08
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06964027
ABSTRACT:
A method and system of optimizing exceptions to default timing constraints for use in integrated circuit design tools is described. A list of exceptions is accessed and optimized to generate a new list of exceptions. Optimizations may include: elimination of redundant information, resolution of conflicting information, and other transformations. The new list allows more efficient timing analysis, synthesis, placement, routing, noise analysis, power analysis, reliability analysis, and other operations to be performed by EDA tools.
REFERENCES:
patent: 6496972 (2002-12-01), Segal
patent: 6678644 (2004-01-01), Segal
Helaihel Rachid N.
Kucukcakar Kayhan
Park Vaughan & Fleming LLP
Siek Vuthe
Synopsys Inc.
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