Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-01-31
2010-12-28
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07861196
ABSTRACT:
Some embodiments provide a method and system for identifying error markers for patterns within a design layout that do not meet the manufacturing constraints. Some embodiments extend a region from the error marked region to extract a pattern for decomposition analysis. Some embodiments compare the extracted pattern to known patterns stored in a library, which also stores at least one previously computed decomposition solution for each known pattern. For an extracted pattern existing within the library, some embodiments retrieve the previously computed decomposition solution from the library. For an extracted pattern that does not exist within the library, some embodiments use one or more simulations to determine a decomposition solution for the extracted pattern. The resulting decomposition solution replaces the extracted pattern within the design layout producing a variant of the original layout that contains the decomposed solution for the pattern.
REFERENCES:
patent: 2008/0069432 (2008-03-01), Hsu et al.
patent: 2008/0144969 (2008-06-01), Park
patent: 2009/0148783 (2009-06-01), Socha
patent: 2010/0017779 (2010-01-01), Kim
patent: 2010/0037200 (2010-02-01), Ghan et al.
U.S. Appl. No. 12/251,455, filed Oct. 14, 2008, Wang, Xiaojun, et al.
Fang Weiping
Huckabay Judy
Kang Chung-Shin
Zhou Shiying
Adeli & Tollen LLP
Cadence Design Systems Inc.
Chiang Jack
Parihar Suchin
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