Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-03-24
2008-08-12
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07412674
ABSTRACT:
A method and apparatus for measuring the progress of a formal verification process using an analysis region, and measures the effectiveness of the current set of properties/requirements in verifying different portions of logic within the design. The present invention applies the concept of analysis region to analyze the properties/requirements for a design. The analysis region can be expanded or contracted either manually or automatically based upon the results of the analysis. The present invention generates a visual display that is available to the user that represents the amount of source code in the analysis region for a given property or multiple properties in comparison to the maximum possible analysis region. The present invention can display this information in a bar graph format, on a line-by-line basis for the source code and on a waveform display, for example.
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Antonioli Yann
Arora Brajesh
Singhal Vigyan
Dinh Paul
Fenwick & West LLP
Jasper Design Automation
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