System and method for measuring a capacitance of a conductor

Details System and method for measuring a capacitance of a conductor System and method for measuring a capacitance of a conductor

2005-02-15

2005-02-15

Chau, Minh H (Department: 2854)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S675000, C324S678000, C324S679000

Reexamination Certificate

active

06856143

ABSTRACT:
A method for measuring a capacitance of a device under test is provided that includes selectively charging and discharging a first conductor with a first set of p and n element-pairs in response to a voltage potential applied to the first set of p and n element-pairs. The method further includes selectively charging and discharging a second conductor with a second set of p and n element-pairs in response to a voltage potential applied to the second set of p and n element-pairs. Currents are measured at drains associated with the first set of p element-pairs as the first and second conductors charge and discharge such that a capacitance associated with the first conductor may be determined that is based on the drain currents.

REFERENCES:
patent: 5999010 (1999-12-01), Arora et al.
patent: 6366098 (2002-04-01), Froment
patent: 6404222 (2002-06-01), Fan et al.
patent: 6501283 (2002-12-01), Lindolf et al.
patent: 6549029 (2003-04-01), Hsieh et al.

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