Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-04-04
2006-04-04
Chawan, Sheela (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S149000, C382S199000, C348S126000, C250S559160
Reexamination Certificate
active
07024031
ABSTRACT:
A system for inspecting components is provided. The system includes an axial lighting system that illuminates the component with axial lighting to allow one or more features of the component to be located, such as by causing protruding features to be brighter than the background and recessed features to be darker than the background. An off-axis lighting system illuminates the component with off-axis lighting in the absence of the axial lighting to allow the component to be inspected to locate one or more features, such as a bump contact.
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Carrington Thomas Casey
Castellanos-Nolasco Ramiro
Guest Clyde Maxwell
Harris Charles Kenneth
Mathur Sanjeev
August Technology Corp.
Chawan Sheela
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