4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Sanjeev Mathur

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System and method for inspecting a component using...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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System and method for inspection using off-angle lighting

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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System and method for inspection using white light...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2931755

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