Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2007-08-07
2007-08-07
Le, Vu A. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S200000
Reexamination Certificate
active
11307785
ABSTRACT:
A system and method for achieving enhanced e-fuse programming reliability. By providing an e-fuse device with redundantly coded fuse structures each with a differing fuse size dimension, reliable encoding of a fuse with a programmed bit is enhanced. That is, for each e-fuse device, each of the multiple fuse structures and a corresponding programming devices associated with each fuse structure is dimensioned to achieve the coding redundancy such that one fuse structure of the multiple fuse structures provides for a current flow of sufficient current density to ensure programming reliability of the e-fuse device. In one embodiment, each the corresponding programming transistor device is of substantially identical size and, each fuse structure of the multiple fuse structures is of a different size. Alternately, each fuse structure is of substantially identical size and each programming transistor device is of a different size, thereby ensuring reliable coding over a programmed current range.
REFERENCES:
patent: 4914055 (1990-04-01), Gordon et al.
patent: 5272666 (1993-12-01), Tsang et al.
patent: 5412593 (1995-05-01), Magel et al.
patent: 5621691 (1997-04-01), Park
patent: 5903041 (1999-05-01), La Fleur et al.
patent: 6096580 (2000-08-01), Iyer et al.
patent: 6323534 (2001-11-01), Marr et al.
patent: 6346846 (2002-02-01), Bertin et al.
patent: 6388305 (2002-05-01), Bertin et al.
patent: 6396120 (2002-05-01), Bertin et al.
patent: 6396121 (2002-05-01), Bertin et al.
patent: 6433404 (2002-08-01), Iyer et al.
patent: 6498056 (2002-12-01), Motsiff et al.
patent: 6512284 (2003-01-01), Schulte et al.
patent: 6570207 (2003-05-01), Hsu et al.
patent: 6577156 (2003-06-01), Anand et al.
patent: 6617914 (2003-09-01), Kothandaraman
patent: 6621324 (2003-09-01), Fifield et al.
patent: 6624031 (2003-09-01), Abadeer et al.
patent: 6624499 (2003-09-01), Kothandaraman et al.
patent: 6661330 (2003-12-01), Young
patent: 6750530 (2004-06-01), Klaasen et al.
patent: 6751137 (2004-06-01), Park et al.
patent: 6753590 (2004-06-01), Fifield et al.
patent: 6794726 (2004-09-01), Radens et al.
patent: 6853049 (2005-02-01), Herner
patent: 6879021 (2005-04-01), Fitfield et al.
patent: 6882027 (2005-04-01), Brintzinger et al.
patent: 6927997 (2005-08-01), Lee et al.
patent: 6944054 (2005-09-01), Rueckes et al.
patent: 6972614 (2005-12-01), Anderson, II et al.
patent: 7087499 (2006-08-01), Rankin et al.
patent: 2004/0004268 (2004-01-01), Brown et al.
patent: 2005/0247997 (2005-11-01), Chung et al.
patent: 2006/0102982 (2006-05-01), Park et al.
patent: 2006/0278932 (2006-12-01), Kothandaraman et al.
patent: WO 2004/100271 (2004-11-01), None
patent: WO 2006/028946 (2006-03-01), None
C. Kothandaraman et al., “Electrically Programmable Fuse (eFUSE) Using Electromigration in Silicides”, IEEE Electron Device Letters, vol. 23, No. 9, Sep. 2002, pp. 523-525.
U.S. Appl. No. 11/307,785, entitled, “System and Method for Increasing Reliability of Electrical Fuse Programming”, filed Feb. 22, 2006, to Byeongju Park et al.
U.S. Appl. No. 11/462,070, entitled, “Anti-Fuse Structure Optionally Integrated With Guard Ring Structure”, filed Aug. 3, 2006, to James W. Adkisson et al.
U.S. Appl. No. 11/366,879, entitled, “Programmable Anti-Fuse Structures, Methods for Fabricating Programmable Anti-Fuse Structures, and Methods of Programming Anti-Fuse Structures”, filed Mar. 2, 2006, to Louis C. Hsu.
U.S. Appl. No. 11/161,320, entitled, “Doped Single Crystal Silicon Silicided Efuse”, filed Jul. 29, 2005, to William R. Tonti et al.
U.S. Appl. No. 11/266,740, entitled, “Efuse and Methods of Manufacturing the Same”, filed Nov. 3, 2005, to William R. Tonti et al.
Park Byeongju
Safran John M.
Abate Esq. Joseph P.
Scully , Scott, Murphy & Presser, P.C.
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