Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-01-04
2011-01-04
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07865857
ABSTRACT:
Features are provided for graphically representing constraints on design objects in an Electronic Design Automation tool. A particular constraint on one or more circuit objects is displayed as a highlighted region that extends to each visible circuit object to which the constraint applies. Attributes of the highlighted region, such as density and thickness, may proportionally represent attributes of the constraint, such as a strength or distance specified by the constraint. The highlighted region is superimposed on or around circuit objects. The highlighted region may be a halo, which is a partially transparent region filled with a color. Multiple regions that represent the same type of constraint or relationship are connected by line segments, providing the ability to visualize groups of constrained objects, including groups that span levels of a hierarchical design. Intersecting highlighted regions are blended together using techniques such as alpha blending.
REFERENCES:
patent: 6609236 (2003-08-01), Watanabe et al.
patent: 7418683 (2008-08-01), Sonnard et al.
patent: 2003/0014725 (2003-01-01), Sato et al.
Arora Sumit
Chopra Amit
Gebbie Ian
O'Riordan Donald
Sonnard Jean-Daniel
Cadence Design Systems Inc.
Lin Aric
Schwegman Lundberg & Woessner, P.A.
Siek Vuthe
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