Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-14
2005-06-14
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
06907589
ABSTRACT:
A method and software product evaluate vias, per pad, in an electronic design. One or more via per pad rules are formulated, and then the electronic design is processed to determine whether the vias of the electronic design violate the via per pad rules. In the event of a violation, one or more indicators are generated to identify vias that violate the via per pad rules. The indicators are visual indicators (e.g., via per pad DRCs) on a graphical user interface, and/or a textual report summarizing violations.
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Bertrand Nathan
Frank Mark D.
Nelson Jerimy
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