Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-08-30
2005-08-30
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06938230
ABSTRACT:
A method evaluates signal trace discontinuities in an electronic design of the type having one or more traces. The method includes the steps of formulating one or more trace discontinuity rules, processing the electronic design to determine whether the traces violate the trace discontinuity rules, and generating an indicator (e.g., a DRC) associated with the electronic design to identify violated trace discontinuity rules. Each level, each signal net, or a group of signal nets may be evaluated, for example, to ensure compliance with the trace discontinuity rules.
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Frank Mark D.
Nelson Jerimy
Quint David W.
Hewlett--Packard Development Company, L.P.
Lin Sun James
Whitmore Stacy A.
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