Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-05-30
2006-05-30
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07055124
ABSTRACT:
A method is provided for evaluating signal deviations in an electronic design (e.g., a package design), including the steps of: formulating one or more signal deviation rules; processing the electronic design to determine whether the signal deviations violate the signal deviation rules; and generating an indicator (e.g., a DRC and/or report) associated with the electronic design to identify violated signal deviation rules. Processing of the electronic design may be scoped according one or a group of signal nets.
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Frank Mark D.
Nelson Jerimy
Quint David W.
Hewlett--Packard Development Company, L.P.
Siek Vuthe
Tat Binh
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