Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-05-06
2009-11-03
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07612571
ABSTRACT:
Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation emission information is collected from the device to be tested during electrical operation. Characteristic features of the radiation emission information are determined, and differences between the characteristic features are deciphered. Based on the differences, models are employed to determine electrical properties of the device, especially operational characteristics.
REFERENCES:
patent: 5598100 (1997-01-01), Maeda et al.
patent: 5940545 (1999-08-01), Kash et al.
patent: 6078183 (2000-06-01), Cole, Jr.
A.Tosi, F. Stellari, F. Zappa, S. Cova, Backside Flip-Chip testing by means of high-bandwidth luminescence detection, Microelectronics Reliability 43, 2003, pp. 1669-1674, Elsevier LTD.
F. Stellari, F. Zappa, S. Cova, L. Vendrame, Tools for Non-Invasive Optical Characterization of CMOS Circuits, STMicroelectronics, 1999 IEEE, pp. 487-490, Milano- Italy.
A. Tosi, F. Stellari, F. Zappa, S. Cova, Hot-carrier luminescence: comaprison of different CMOS technologies, 2003 IEEE, pp. 351-353, Milano (Italy).
E. Menzel and E. Kubalek, Fundamentals of Electron Beam Testing of Integrated Circuits, Scanning vol. 5, 1983, pp. 103-122, FACM Publishing Inc.
J.C. Tsang, J.A. Kash, Picosecond hot electron light emission from submicron complementary metal-oxide-semiconductor circuits, American Institute of Physics, Feb. 17, 1997, pp. 889-891, vol. 70 No. 7.
S. Polonsky, A. Weger, M. McManus, Picosecond Imaging Circuit Analysis of Leakage Currents in CMOS Circuits, Proceedings from the 28th International Symposium for Testing and Failure analysis, Nov. 2002, pp. 387-390, Phoenix, Arizona.
S. Tam, C. Hu, Hot-Electron-Induced Photon and Photocarrier Generation in Silicon MOSFET's, IEEE Transactions on Electron Devices, vol. ED-31, No. 9, Sep. 1984, pp. 1264-1273.
T. Eiles, G. Woods, V. Rao, Optical Probing of Flip-Chip-Packaged Microprocessors, 2000 IEEE International Solid-State Circuits Conference, TD: Low Temp, Circuits & Diagnostic Techniques, 2000, pp. 220-221, Session 13.
Song Peilin
Stellari Franco
Tosi Alberto
Dougherty, Esq. Anne V.
International Business Machines - Corporation
Keusey, Tutunjian & & Bitetto, P.C.
Nguyen Vinh P
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