System and method for distortion analysis

Details System and method for distortion analysis System and method for distortion analysis

2011-04-05

2011-04-05

Dole, Timothy J (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

C330S149000, C455S501000, C375S278000

Reexamination Certificate

active

07919968

ABSTRACT:
A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured.

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patent: 2006/0088125 (2006-04-01), Miyatani et al.

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